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LCP-20 Measurement of Diffraction Intensity -Enhanced Model

This instrument is designed to learn diffraction and interference effects of single-slit, multi-slit, and single-wire. Specifications
Optical Rail length: 1.0 m
Semiconductor Laser 3.0 mW @650 nm
Diffraction Element Single-Slit slit width: 0.07 mm, 0.10 mm, and 0.12 mm
Single-Wire diameter: 0.10 mm and 0.12 mm
Double-Slit slit width 0.02 mm , central spacing 0.04 mm
Double-Slit slit width 0.07 mm , central spacing 0.14 mm
Double-Slit slit width 0.07 mm , central spacing 0.21 mm
Double-Slit slit width 0.07 mm , central spacing 0.28 mm
Triple-Slit slit width 0.02 mm , central spacing 0.04 mm
Quadruple-Slit slit width 0.02 mm , central spacing 0.04 mm
Pentuple-Slit slit width 0.02 mm , central spacing 0.04 mm
Photocell Detector (Option 1) incl 0.1 mm reading ruler & amplifier, connected to a galvanometer
CCD (Option 2) pixel number: 2700; size: 11×11 μm; spectral range: 0.3~0.9 μm
with synchronization/signal ports, connected to an oscilloscope
CCD+Software (Option 3) incl Option 2
data acquisition box and software for PC use via USB

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